ASTM E1508
Energy Dispersive Spectroscopy for Quantitative Analysis with a scanning electron microscope
Purpose: Contamination analysis, particle identification, failure analysis, inorganic filler identification, plating identification
Sample: Solid sample of any form.
Price & Delivery: Contact us for a quote.
Basic Description: High energy elections interact with the atoms within the top few microns of the sample and give off a measurable energy unique to the atoms present.
Equipment: Joel 6360LV Scanning Electron Microscope with Oxford X-Max EDS attachment
Method Publisher: https://www.astm.org/e1508-12ar19.html
Keywords:
- Composition
- Contamination
- Particle Identification
- Scanning Electron Microscope (SEM)
Related Test Methods:
- SEM/EDS
- ASTM B748 (Plating Thickness)
- Failure Analysis
- Inorganic Filler Identification