ASTM E1508

Energy Dispersive Spectroscopy for Quantitative Analysis with a scanning electron microscope

Purpose: Contamination analysis, particle identification, failure analysis, inorganic filler identification, plating identification

Sample: Solid sample of any form.

Price & Delivery: Contact us for a quote.

Basic Description: High energy elections interact with the atoms within the top few microns of the sample and give off a measurable energy unique to the atoms present.

Equipment: Joel 6360LV Scanning Electron Microscope with Oxford X-Max EDS attachment

Method Publisher: https://www.astm.org/e1508-12ar19.html

Keywords:

  • Composition
  • Contamination
  • Particle Identification
  • Scanning Electron Microscope (SEM)

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