ASTM B487
Plating Thickness by Cross Section / X-Section
Purpose: Measure the thickness of a layer or sample via optical microscope
Sample: Any material that can be cut to 1” x 1”, mounted, and polished
Price & Delivery: Contact us for a quote.
Basic Description: A section of material is mounted, polished, and measured in cross section via optical microscope
Limitations: Sample must be able to mounted and polished, layers must be visibly distinguishable from one another, and thickness range must be within the optical resolution of the microscope
Equipment: Polyvar light microscope with optical filar attachment
Method Publisher: https://www.astm.org/b0487-20.html
Keywords:
- Referee Plating Thickness
- Cross Section
- Coating
Related Test Methods:
- ASTM B748
- ASTM B568
- ASTM B244
- ASTM B499