ASTM B487

Plating Thickness by Cross Section / X-Section

Purpose: Measure the thickness of a layer or sample via optical microscope

Sample: Any material that can be cut to 1” x 1”, mounted, and polished

Price & Delivery: Contact us for a quote. 

Basic Description:  A section of material is mounted, polished, and measured in cross section via optical microscope

Limitations: Sample must be able to mounted and polished, layers must be visibly distinguishable from one another, and thickness range must be within the optical resolution of the microscope

Equipment: Polyvar light microscope with optical filar attachment

Method Publisher: https://www.astm.org/b0487-20.html

Keywords: 

  • Referee Plating Thickness
  • Cross Section 
  • Coating

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